Universal palmtop X-ray fluorescence analyzer enables accurate coating thickness measurement and material analysis even in difficult and complex material combinations. Meet DIN ISO 3497 and ASTM B 568 standards

Weight 1.9kg

* Lasts 6 hours on a single battery charge

Measuring point: 3 mm

High resolution silicon drift detector

IP54 etc. for outdoor use *

Optional measuring box for table type equipment;

The full WinFTM software was used for data statistics